Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...
Software engineering guidelines and textbooks, etc., are generally written with engineers in mind, but how about when you ...
Design News webinar explores the industry trends affecting electronics testing and how vendors are responding with more ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
In too many instances, test is still an afterthought of design, which slows the development process and lengthens time to market. Dr. James Truchard of National Instruments discusses the benefits of ...
In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...
With the move to advanced process technologies, concerns over device power once largely limited to specialized markets have escalated rapidly among mainstream designers. More semiconductor companies ...
As design pushes deeper into data-driven architectures, so does test. Geir Eide, director for product management of DFT and Tessent Silicon Lifecycle Solutions at Siemens Digital Industries Software, ...
Omron showcased advanced testing tools for compact electronics, featuring blade pins, relays, and more at DesignCon 2026.
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