Description: Discusses different aspects of VLSI testing and formal verification of designs. Design and manufacturing defect models are introduced along with test generation and fault simulation ...

During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...

Weakness in the semiconductor industry pushed sales of IC wafer testing probe cards down to half of the five-year historic average, or 13.9%, in 2007 according to Santa Clara, Calif.-based market ...

This link below contains information about the Cadence design tools used extensively in classes in the Electrical and Computer Engineering Department at UMass Lowell. Students obtain practical ...